Surface topography using diffuse point differential interferometry-Reference-Cited by-同舟云学术

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Surface topography using diffuse point differential interferometry

Published:1989-01 Issue:2 Volume:10 Page:81-96
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Azzazy M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Stylus profiling instrument for measuring statistical properties of smooth optical surfaces;Bennett;Appl. Opt.,1981

2. Direct comparison of mechanical and optical measurements of the finish of precision machined optical surfaces;Church;Opt. Eng.,1985

3. Measurement of surface topography of magnetic tapes by Mirau interferometry;Bhusham;Appl. Opt.,1985

4. Surface roughness measurement by digital processing of Nomarski phase contrast images;Jabr;Opt. Lett.,1985

5. Study of surface roughness using a microdensitometer analysis of electron micrographs of surface replicas: I surface profiles;Rasigni;J. Opts. Soc. Am.,1981

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