An integrated debugging system based on E-beam test-Reference-Cited by-同舟云学术

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An integrated debugging system based on E-beam test

Published:1987-01 Issue:2-4 Volume:7 Page:275-282
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Guiguet Isabelle,Marzouki Meryem,Courtois Bernard

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Scanning electron beam probes VLSI chips;Fazekas;Electronics,1981

2. The practical implementation of voltage contrast as a diagnostic tool;Bertshe,1982

3. Systeme d'analyse fonctionnelle par faisceaux d'électrons;Barre,1984

4. Présentation de TESSIE: testeur de circuits intégrés;Baudrand,1985

5. Architecture of a multiprocessor for pictures capture and processing;Bretagnolle,1979

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Automatic fault tracing by successive circuit extraction from CAD layout data with the CAD-linked EB test system;Microelectronics Reliability;1998-06

2. Multipurpose e-beam system for microelectronic structure testing;Microelectronic Engineering;1992-03

3. Model-based reasoning for electron-beam debugging of VLSI circuits;Journal of Electronic Testing;1991-11

4. Timing diagram: A new electron-beam test technique for linking IC-internal measurements to simulation;Microelectronic Engineering;1990-05

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