Author:
Stentiford F.W.M.,Twell T.J.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference3 articles.
1. A new domain for image analysis: VLSI circuits testing, with ROMAULD, specialised in image processing;Du Merac;Pattern Recognition Letters,1983
2. Automated fault diagnostic EB tester and its application to a 40K-gate VLSI circuit;Tamama,1985
3. A fully automated electron beam test system for VLSI circuits;Kuji;IEEE Design and Test,1985
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9 articles.
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