Nanoscale microstructural analysis of metallic materials by atom probe field ion microscopy
Author:
Publisher
Elsevier BV
Subject
General Materials Science
Reference280 articles.
1. The Atom‐Probe Field Ion Microscope
2. Imaging atom-probe mass spectroscopy
3. Application of a position‐sensitive detector to atom probe microanalysis
4. Materials analysis with a position-sensitive atom probe
5. The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale
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