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2. The JSPS117 Committee, Procedures for the measurements of lattice constants and crystallite sizes of graphitized materials, and Inagaki M, Explanations on the procedures;TANSO,1963
3. Specification for the procedure of X-ray diffraction measurements on carbon materials;Iwashita;Carbon,2004
4. Japanese Industrial Standards (JIS) R7651:2007 [in Japanese].
5. Microstructure and crystallinity of highly crystallized graphite films prepared from aromatic polyimide films;Kaburagi;TANSO,1995