Recent Development in Focused Ion Beam Nanofabrication-Reference-Cited by-同舟云学术

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Recent Development in Focused Ion Beam Nanofabrication

Published:2019 Issue: Volume: Page:327-356
ISSN:
Container-title:Comprehensive Nanoscience and Nanotechnology
language:
Short-container-title:

Author:

Kong Charlie,Cheong Soshan,Tilley Richard D.

Publisher

Elsevier

Reference309 articles.

1. Handbook of Charged Particle Optics;Orloff,2008

2. Focused ion beams in microfabrication;Seliger;Journal of Vacuum Science and Technology,1973

3. Levi-Setti, R., 1974. Proton scanning microscopy: Feasibility and promise. In: Proceedings of the 7th Annual Scanning Electron Microscopy Symposium, 125.

4. Intense field‐emission ion source of liquid metals;Clampitt;Journal of Vacuum Science & Technology,1975

5. Study of a field-ionization source for microprobe applications;Orloff;Journal of Vacuum Science & Technology,1975

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Current–voltage characteristics of focused ion beam fabricated superconducting tungsten meanders;Nanotechnology;2023-10-19

2. Research Progress of Residual Stress Measurement Methods;2023

3. Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures;Ultramicroscopy;2022-04

4. Comparative Apex Electrostatics of Atom Probe Tomography Specimens;Journal of Electronic Materials;2021-04-28

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