1. R. C. Teague, “Nanometrology”, Proc. of Engineering Foundations Conference on Scanning Probe Microscopes: STM and Beyond”, Santa Barbara, Jan. 1991, published by The American Physical Society.
2. “Documents Concerning the New Definition of the Metre,”,1984
3. “A New Microcomputer-Controlled Laser Dimensional Measurement and Analysis System,”;Quenelle;Hewlett-Packard Journal,1983
4. “Interferometric Measurement of Length Scales at the National Bureau of Standards,”;Beers;Precision Engineering Journal,1982