New Concepts of Precision Dimensional Measurement for Modern Manufacturing

Author:

SWYT DENNIS A.

Publisher

Elsevier

Reference22 articles.

1. R. C. Teague, “Nanometrology”, Proc. of Engineering Foundations Conference on Scanning Probe Microscopes: STM and Beyond”, Santa Barbara, Jan. 1991, published by The American Physical Society.

2. “Documents Concerning the New Definition of the Metre,”,1984

3. “A New Microcomputer-Controlled Laser Dimensional Measurement and Analysis System,”;Quenelle;Hewlett-Packard Journal,1983

4. “Interferometric Measurement of Length Scales at the National Bureau of Standards,”;Beers;Precision Engineering Journal,1982

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