Author:
Pavlidis Georges,Foley Brian,Graham Samuel
Reference64 articles.
1. DC technique for determining GaAs MESFET thermal resistance;Estreich;IEEE Trans. Compon. Packag. Manuf. Technol.,1989
2. Measurement and modeling of self-heating effects in SOI nMOSFETs;Su,1992
3. GaN HEMT reliability;del Alamo;Microelectron. Reliab.,2009
4. Self-heating in high-power AlGaN-GaN HFETs;Gaska;IEEE Electron Device Lett.,1998
5. Determination of channel temperature in AlGaN/GaN HEMTs grown on sapphire and silicon substrates using DC characterization method;Kuzmík;IEEE Trans. Electron Devices,2002