BALLISTIC ELECTRON EMISSION MICROSCOPY
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Publisher
Elsevier
Reference40 articles.
1. The structure and properties of metal-semiconductor interfaces
2. Semiconductor Interfaces: Formation and Properties;Le Lay,1987
3. Mean Free Path of Photoexcited Electrons in Au
4. RANGE OF PHOTOEXCITED HOLES IN Au
5. Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Loss of polarization in a hot-electron current through electron-electron scattering;Journal of Applied Physics;2005-11
2. Interface Applications of Scanning Near-Field Optical Microscopy with a Free Electron Laser;physica status solidi (a);1999-09
3. Hot electron transport across metal-semiconductor interfaces probed by ballistic electron emission spectroscopy;Physica Scripta;1994-01-01
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