Author:
Singh Mukesh Kumar,Singh Annika
Reference26 articles.
1. Ana I. S. N, Daniela P. R, Adolfo De S, Elias T A, Maria S. P, Vitor S. A, Luis V. M, Saverio R, Isabel de S, Helena A & Monica F. C (2017) Nature: Sci. Reports, 1–11
2. High-speed atomic force microscopy coming of age;Ando;Nanotechnology.,2012
3. Baalousha M. and Lead J. R. (2012) Rationalizing Nanomaterial Sizes Measured by Atomic Force Microscopy, Flow Field-Flow Fractionation, and Dynamic Light Scattering: Sample Preparation, Polydispersity, and Particle Structure. Environ. Sci. Technol., 46(11), 6134–6142
4. Berg VR, Groot D H, Dijk V M A & Denley D R(1994), Atomic force microscopy of thin triblock copolymer films. Polymer, 35(26); 5778–5781
5. Binnig G, Rohrer H, Gerber Ch & Weibel E, (1982)Surface studies by scanning tunneling Microscopy, Physical Review Letters. 49(1), 57–60