Extremely Thin Films
Author:
Publisher
Elsevier
Reference20 articles.
1. Ueber Oberflächenschichten. II. Theil
2. Changes in the Phase and Amplitude of Polarized Light Reflected from a Film-Covered Surface and Their Relations with the Film Thickness
3. “Ellipsometry in the Measurement of Surfaces and Thin Films,”;Archer,1964
4. Optical Measurement of Film Growth on Silicon and Germanium Surfaces in Room Air
5. Measurement of oxygen adsorption on silicon by ellipsometry
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1. Influence of the SiO2 interlayer thickness on the density and polarity of charges in Si/SiO2/Al2O3 stacks as studied by optical second-harmonic generation;Journal of Applied Physics;2014-01-21
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