Outlier-resistant methods for estimation and model fitting-Reference-Cited by-同舟云学术

Outlier-resistant methods for estimation and model fitting

Published:1994-12 Issue:4 Volume:33 Page:411-420
ISSN:0019-0578
Container-title:ISA Transactions
language:en
Short-container-title:ISA Transactions

Author:

Vecchia D.F.,Splett J.D.

Publisher

Elsevier BV

Subject

Applied Mathematics,Control and Systems Engineering,Electrical and Electronic Engineering,Computer Science Applications,Instrumentation

Reference19 articles.

1. The breakdown points of the mean combined with some rejection rules;Hampel;Technometrics,1985

2. Semiconductor measurement technology: Interlaboratory study on linewidth measurements for antireflective chromium photomasks;Jerke;NBS Special Publication 400-74,1982

3. Robust Regression and Outlier Detection;Rousseeuw,1987

4. Robust Statistics: The Approach Based on Influence Functions;Hampel,1986

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