Improvement and application of the fourier-transformed pattern from a small area of high resolution electron microscope images
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Optical selected-area diffraction patterns of high-resolution electron-microscope images for crystal analysis
2. Construction of an on-line system for FFT processing and analysis of atomic resolution microscopic images and its applications
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4. The Theoretical Resolution Limit of the Electron Microscope
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