Asymmetrical dark field detectors in the stem-Reference-Cited by-同舟云学术

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Asymmetrical dark field detectors in the stem

Published:1976-01 Issue: Volume:2 Page:351-360
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Beck V.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. The Use of Diffraction Information to Augment STEM Imaging;Cowley,1976

2. High resolution imaging properties of the stem

3. Principles of Optics;Born,1965

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2. Notes and References;Principles of Electron Optics, Volume 3;2022

3. Chicago aberration correction work;Ultramicroscopy;2012-12

4. Notes and References for Volume 3;Principles of Electron Optics;1996

5. A versatile, software configurable multichannel STEM detector for angle-resolved imaging;Ultramicroscopy;1994-05

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