A study of the validity of the image deconvolution method on the basis of channelling theory for thicker crystals
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Measurement and compensation of defocusing and aberrations by Fourier processing of electron micrographs
2. Digital image processing: The semper system
3. IMAGE DECONVOLUTION IN HIGH RESOLUTION ELECTRON MICROSCOPY BY MAKING USE OF SAYRE'S EQUATION
4. Digital reconstruction of bright field phase contrast images from high resolution electron micrographs
5. Wave function reconstruction in HRTEM: the parabola method
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