Charging phenomena in PEEM imaging and spectroscopy-Reference-Cited by-同舟云学术

Charging phenomena in PEEM imaging and spectroscopy

Published:2000-05 Issue:1-2 Volume:83 Page:129-139
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Gilbert B,Andres R,Perfetti P,Margaritondo G,Rempfer G,De Stasio Gelsomina

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. LEEM Basics

2. O.H. Griffith, W. Engel (Eds.), Proceedings of the Second International Symposium and Workshop on Emission Microscopy and Related Techniques (special issue), Ultramicroscopy 36 (1990).

3. Photoelectron microscopy with synchrotron radiation

4. Fast elemental mapping and magnetic imaging with high lateral resolution using a novel photoemission microscope

5. SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter

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