Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Automatic analysis of electron backscatter diffraction patterns
2. Automated crystal lattice orientation mapping using a computer-controlled SEM
3. Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups
4. Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns
5. Measurement of crystal parameters on backscatter kikuchi diffraction patterns
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4. Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns;Journal of Applied Crystallography;2021-05-28
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