Development of methodology for low exposure, high resolution electron microscopy of biological specimens

Author:

Kuo Ivy Ai Ming,Glaeser Robert M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. Specimen damage caused by the beam of the transmission electron microscope, a correlative reconsideration

2. Physical Aspects of Electron Microscopy and Microbeam Analysis;Glaeser,1975

3. Limitations to significant information in biological electron microscopy as a result of radiation damage

4. 29th Ann. Proc. Electron Microscopy Soc. Amer.;Glaeser,1971

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