Aperture contrast in thick amorphous specimens using scanning transmission electron microscopy-Reference-Cited by-同舟云学术

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Aperture contrast in thick amorphous specimens using scanning transmission electron microscopy

Published:1975-01 Issue:2 Volume:1 Page:127-136
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Smith David J.,Cowley J.M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Scanning Electron Microscopy/1972;Reimer,1972

2. Scanning Electron Microscopy/1973;Sellar,1973

3. 30th Ann. Proc. EMSA;Koike,1972

4. Measurement of the top bottom effect in scanning transmission electron microscopy of thick amorphous specimens

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