Surface damage formation during ion-beam thinning of samples for transmission electron microscopy-Reference-Cited by-同舟云学术

Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

Published:2001-04 Issue:3 Volume:87 Page:97-104
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

McCaffrey J.P.,Phaneuf M.W.,Madsen L.D.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. J.C. Bravman, R.M. Anderson, M.L. McDonald (Eds.), Specimen Preparation for Transmission Electron Microscopy of Materials, Vol. 115, Materials Research Society, Pittsburgh, PA, 1988.

2. R. Anderson (Ed.), Specimen Preparation for Transmission Electron Microscopy of Materials II, Vol. 199, Materials Research Society, Pittsburgh, PA, 1990.

3. R. Anderson, B. Tracy, J. Bravman (Eds.), Specimen Preparation for Transmission Electron Microscopy of Materials III, Vol. 254, Materials Research Society, Pittsburgh, PA, 1992.

4. R.M. Anderson, S.D. Walck (Eds.), Specimen Preparation for Transmission Electron Microscopy of Materials IV, Vol. 480, Materials Research Society, Pittsburgh, PA, 1997.

5. Small-angle cleavage of semiconductors for transmission electron microscopy

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