A model accounting for spatial overlaps in 3D atom-probe microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Application of a position‐sensitive detector to atom probe microanalysis
2. An atom probe for three-dimensional tomography
3. Three-dimensional imaging of chemical order with the tomographic atom-probe
4. Trajectories of field emitted ions in 3D atom-probe
5. The shape of field emitters and the ion trajectories in three-dimensional atom probes
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