Analysis and evaluation of uniformity of SWIR InGaAs FPA – Part II: Processing issues and overall effects-Reference-Cited by-同舟云学术

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Analysis and evaluation of uniformity of SWIR InGaAs FPA – Part II: Processing issues and overall effects

Published:2013-05 Issue: Volume:58 Page:69-73
ISSN:1350-4495
Container-title:Infrared Physics & Technology
language:en
Short-container-title:Infrared Physics & Technology

Author:

Li Cheng,Zhang Yong-gang,Gu Yi,Wang Kai,Fang Xiang,Li Xue,Li Hao-si-bai-yin

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Third-generation infrared photodetector arrays;Rogalski;J. Appl. Phys.,2009

2. Scene based nonuniformity correction in thermal images using Kalman filter;Amir;Image Vision Comput.,2007

3. Nonuniformity correction for improved registration and high-resolution image reconstruction in IR imagery;Armstrong;SPIE,1999

4. Nonuniformity correction and thermal drift compensation of thermal infrared camera;Riou;SPIE,2004

5. Responsivity uniformity of infrared detector arrays;Norton;Semiconduct. Sci. Technol.,1991

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1. Relationship between epi-wafer photoluminescence and focal plane array performances of InGaAs detectors;Materials Science in Semiconductor Processing;2023-04

2. Short-wave infrared InGaAs photodetectors and focal plane arrays;Chinese Physics B;2018-12

3. Composition uniformity characterization and improvement of AlGaAs/GaAs grown by molecular beam epitaxy;Materials Science in Semiconductor Processing;2018-06

4. Numerical simulation of the modulation transfer function in planar InGaAs dense arrays;Infrared Physics & Technology;2017-09

5. InP-based antimony-free lasers and photodetectors in 2 similar to 3 mu m band;J INFRARED MILLIM W;2016

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