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Analysis and evaluation of uniformity of SWIR InGaAs FPA—Part I: Material issues

  • Published:2011-11 Issue:6 Volume:54 Page:497-502
  • ISSN:1350-4495
  • Container-title:Infrared Physics & Technology
  • language:en
  • Short-container-title:Infrared Physics & Technology

Author:

Gu Yi,Zhang Yong-gang,Li Cheng,Wang Kai,Li Hao-si-bai-yin,Li Xue,Fang Xiang

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Overview of SWIR detectors, cameras, and applications;Hansen;Proc. SPIE,2008

2. Extended wavelength InGaAs infrared (1.0–2.4μm) detector arrays on SCIAMACHY for space-based spectrometry of the earth atmosphere;Hoogeveen;Infrared Phys. Technol.,2001

3. 640×512 InGaAs focal plane array camera for visible and SWIR imaging;Martin;Proc. SPIE,2005

4. Infrared image sensors;Norton;Opt. Eng.,1991

5. Uniformity of infrared detector parameters in alloy semiconductors;Long;Infrared Phys.,1972

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