Machine-vision-based identification for wafer tracking in solar cell manufacturing

Author:

Tsai Du-Ming,Lin Ming-Chin

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,General Mathematics,Software,Control and Systems Engineering

Reference23 articles.

1. Automatic identification and data collection: scaning into the future;Hill;Achieving Supply Chain Excellence through Technology,2000

2. Markkainen, M, Ala-Risku, T. Automatic identification—applications and technologies. In: Logistics research network eighth annual conference; 2003, London, UK.

3. Auto ID systems and intelligent manufacturing control;Mcfarlane;Engineering Applications of Artificial Intelligence,2003

4. Rein, S, Krieg, AWeil, A, Emanuel, G, Glathaar, M, Grohe, A et al. Single-wafer tracking in PV production lines. In: The 23rd European photovoltaic solar energy conference and exhibition; 2008, Valencia, Spain.

5. Decomposition of Hardy functions into square integrable wavelets of constant shape;Grossmann;SIAM Journal on Mathematics,1984

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