A two-phase dynamic dispatching approach to semiconductor wafer testing-Reference-Cited by-同舟云学术

A two-phase dynamic dispatching approach to semiconductor wafer testing

Published:2011-10 Issue:5 Volume:27 Page:889-901
ISSN:0736-5845
Container-title:Robotics and Computer-Integrated Manufacturing
language:en
Short-container-title:Robotics and Computer-Integrated Manufacturing

Author:

Chen Yin-Yann,Lin James T.,Chen Tzu-Li

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,General Mathematics,Software,Control and Systems Engineering

Reference18 articles.

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2. A review of production planning and scheduling models in the semiconductor industry, Part I: system characteristics, performance evaluation and production planning;Uzsoy;IIE Trans,1992

3. Scheduling semiconductor test operations: minimizing maximum lateness and number of tardy jobs on a single machine;Uzsoy;Nav Res Logist,1992

4. Performance evaluation of dispatching rules for semiconductor testing operations;Uzsoy;J Electron Manuf,1993

5. Perry CN, Uzsoy R. Reactive scheduling of a semiconductor testing facility. In: Proceedings of the fifteenth IEEE/CHMT international electronics manufacturing technology symposium, 1993. p. 191–4.

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