Data science at farm level: Explaining and predicting within-farm variability in potato growth and yield

Author:

Mulders Puck J.A.M.,van den Heuvel Edwin R.,van den Borne Jacob,van de Molengraft René,Heemels W.P.M.H.(Maurice),Reidsma Pytrik

Funder

European Regional Development Fund

Ministerie van Economische Zaken

Provincie Noord-Brabant

Publisher

Elsevier BV

Subject

Plant Science,Soil Science,Agronomy and Crop Science

Reference55 articles.

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5. Relationship between leaf area index and ground cover in potato under different management conditions;Boyd;Potato Res.,2002

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