Case studies in system burn-in-Reference-Cited by-同舟云学术

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Case studies in system burn-in

Published:1982-01 Issue:1 Volume:3 Page:13-22
ISSN:0143-8174
Container-title:Reliability Engineering
language:en
Short-container-title:Reliability Engineering

Author:

Jensen Finn

Publisher

Elsevier BV

Subject

General Engineering

Reference6 articles.

1. A method for estimating the reliability of IC's;Alexanian;IEEE Trans. Rel.,1977

2. Results from accelerated life testing of memories and from 1–3 years use of microcircuits;Hallberg,1979

3. An analysis of transistor failure data;Kamath,1978

4. The reliability of semiconductor devices in the Bell System;Peck,1974

5. Unpublished report concerning burn-in economies;Petersen,1979

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optimal burn‐in policy based on a set of cutoff points using mixture inverse Gaussian degradation process and copulas;Applied Stochastic Models in Business and Industry;2021-01-10

2. References;Lees' Loss Prevention in the Process Industries;2012

3. References, Part 5;Lees' Loss Prevention in the Process Industries;2005

4. Dual functional distribution of failure in GaAs multichip microwave monolithic integrated circuits (MMICs);IEEE Transactions on Electron Devices;1992

5. Mixed hazard models and their applications;Reliability Engineering & System Safety;1991-01

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