Detection of interface states in an elastic plate using laser ultrasonic technology-Reference-Cited by-同舟云学术

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Detection of interface states in an elastic plate using laser ultrasonic technology

Published:2024-01 Issue: Volume:216 Page:109820
ISSN:0003-682X
Container-title:Applied Acoustics
language:en
Short-container-title:Applied Acoustics

Author:

Zhang Ri-Feng,Ban Rui,Fan Ya-Xian,Tao Zhi-Yong^ORCID

Publisher

Elsevier BV

Subject

Acoustics and Ultrasonics

Reference42 articles.

1. Microwave analogue of Tamm states in periodic chain-like structures;Belozorov;Prog Electrom Res Le,2014

2. A model of interface states and charges at the Si-SiO2 interface: Its predictions and comparison with experiments;Ngai;J Appl Phys,1981

3. Model of electronic states at the Si-SiO2 interface;Carrico;Phys Rev B,1986

4. A model of interface defect states at Si/SiO2 amorphous (non-periodic) interfaces;Beltrán;J Non-Cryst Solids,1993

5. Mechanism of dopant segregation to SiO2/Si(001) interfaces;Dabrowski;Phys Rev B,2002

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