An on-line bulb inspection system using afterglow decay measurements-Reference-Cited by-同舟云学术

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An on-line bulb inspection system using afterglow decay measurements

Published:1992-10 Issue:3 Volume:20 Page:311-319
ISSN:0166-3615
Container-title:Computers in Industry
language:en
Short-container-title:Computers in Industry

Author:

Haq Qureshi A.,Belovich S.G.,Ahmad Monir

Publisher

Elsevier BV

Subject

General Engineering,General Computer Science

Reference5 articles.

1. U.S. Patent 3,194,110;Eppig;Method of detecting oxygen contaminant in sealed envelopes,1965

2. Detection with atomic nitrogen;Krugers,1965

3. Appraisal of incandescent lamp filling gas purity;Eppig;J. Illumin. Eng. Soc.,1982

4. Kinetics of reactions involving CN emission;Setser,1965

5. Spectra of afterglows and discharges from nitrogen-oxygen mixtures;Kurzweg;J. Molec. Spectrosc.,1957

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