Imaging at the picoscale
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference41 articles.
1. Aberration correction for TEM
2. �ber einige Fehler von Elektronenlinsen
3. Principles of electron optics;see Hawkes,1994
4. Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy
5. “Indirect” High-Resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction
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