Relationship between oxide-ion conductivity and dielectric relaxation in Sm-doped CeO2-Reference-Cited by-同舟云学术

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Relationship between oxide-ion conductivity and dielectric relaxation in Sm-doped CeO2

Published:2007-05-31 Issue:13-14 Volume:178 Page:889-893
ISSN:0167-2738
Container-title:Solid State Ionics
language:en
Short-container-title:Solid State Ionics

Author:

Yamamura Hiroshi,Takeda Saori,Kakinuma Katsuyoshi

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Cited by 52 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Zr substitution on the electrical and dielectric properties of the Ce0.6-xZrxY0.4O2-δ solid solutions;International Journal of Hydrogen Energy;2024-01

2. Correlation of oxygen defects, oxide-ion conductivity and dielectric relaxation to electronic structure and room temperature ferromagnetic properties of Yb3+ doped CeO2 nanoparticles;Materials Science and Engineering: B;2023-11

3. Electrical Characteristics of Bismuth-Containing Cerium Oxide;Glass and Ceramics;2023-07

4. Alteration in growth temperatures of metal-organic decomposed GaxCe1-xOyNz passivation layer in nitrogen/oxygen/nitrogen ambient;Ceramics International;2023-05

5. Dielectric relaxation and charge carrier mechanism in doped Ce1-Sm O2-δ (0 ≤ x ≤ 0.3) nanoceramics: An investigation with dielectric spectroscopy;Journal of Physics and Chemistry of Solids;2023-05

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