Parametric line profile analysis for in situ XRD of SnO 2 materials: Separation of size and strain contributions
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference61 articles.
1. In Situ XRD Investigations of Heteropolyacid Catalysts in the Methacrolein to Methacrylic Acid Oxidation Reaction: Structural Changes during the Activation/Deactivation Process
2. Stability of intergranular phases in hot-pressed Si3N4 studied with mechanical spectroscopy and in-situ high-temperature XRD
3. Studies of thermal stability of nanocrystalline SnO2, ZrO2, and SiC for semiconductor and thermocatalytic gas sensors
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