Precision studies of synthetic diamonds using Kossel's method
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Materials Chemistry,Mechanical Engineering,General Chemistry,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Zonal distribution of impurities in diamond
2. Synthetic Materials for Electronics;Vishnevsky,1981
3. Abstr. 2nd All-Union Conf. on Wide-Gap Semiconductors;Sobolev,1979
4. Divergent-beam X-ray photography of crystals
5. Evaluation of Kossel Microdiffraction Procedures: The Cubic Case
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2. Determination of structural inhomogeneity of synthesized diamonds by backscattering electron diffraction;physica status solidi (a);2011-10-14
3. Use of electron diffraction for determination of strain distribution in synthetic diamonds;SPIE Proceedings;2011-09-30
4. Distribution in angular mismatch between crystallites in diamond films grown in microwave plasma;Diamond and Related Materials;2010-05
5. X-ray multiple diffraction in synthesized diamond with a multi-layered structure;Journal of Physics D: Applied Physics;2005-05-06
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