Key technologies for device fabrications and materials characterizations-Reference-Cited by-同舟云学术

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Key technologies for device fabrications and materials characterizations

Published:2018 Issue: Volume: Page:219-294
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Container-title:Power Electronics Device Applications of Diamond Semiconductors
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Elsevier

Reference240 articles.

1. Donor and acceptor states in diamond;Goss;Diamond Relat. Mater.,2004

2. Introduction to Dislocations;Hull,2011

3. Characterization of Crystal Growth Defects by X-ray Methods;Tanner,1980

4. The X-Ray Topography of Diamond;Frank,1965

5. Structural analysis of dislocations in type-IIa single-crystal diamond;Kato;Diamond Relat. Mater.,2012

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Origin of the Surface Facet Dependence in the Oxidative Etching of the Diamond (111) and (100) Surfaces from First-Principles Calculations;The Journal of Physical Chemistry C;2024-04-08

2. Advances in Solid-State Nonlinear Optical Materials: From Fundamentals to Applications;ACS Applied Optical Materials;2023-12-12

3. X-ray induced photoconductivity and its correlation with structural and chemical defects in heteroepitaxial diamond;Journal of Applied Physics;2023-10-04

4. Formation of p-n⁺ diamond homojunctions by shallow doping of phosphorus through liquid emersion excimer laser irradiation;Materials Research Letters;2022-06-06

5. Laser-induced novel ohmic contact formation for effective charge collection in diamond detectors;Materials Science in Semiconductor Processing;2022-03

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