Atomic force microscopy (AFM) for materials characterization

Author:

Khan M.K.,Wang Q.Y.,Fitzpatrick M.E.

Publisher

Elsevier

Reference17 articles.

1. Atomic Force Microscopy-imaging, Measuring and Manipulating Surfaces at the Atomic Scale;Bellitto,2012

2. The magnetic force microscopy and its capability for nanomagnetic studies- the short compendium;Hendrych,2007

3. Analyses of vibration responses on nanoscale processing in a liquid using tapping-mode atomic force microscopy;Horng;Appl Surf Sci,2009

4. Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe;Kageshima;Appl Surf Sci,2002

5. Method to account for true contact area in soda lime glass during nanoindentation with the Berkovich tip;Kese;Mater Sci Eng A,2005

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