X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF SIMS)-Reference-Cited by-同舟云学术

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X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF SIMS)

Published:2017 Issue: Volume: Page:83-97
ISSN:
Container-title:Characterization of Polymeric Biomaterials
language:
Short-container-title:

Author:

Yahia L'H.,Mireles L.K.

Publisher

Elsevier

Reference14 articles.

1. ToF-SIMS: surface analysis by mass spectrometry hardcover;Vickerman,2001

2. Surface modification of biopolymers;Thakur,2015

3. Nanotechnology in agriculture: prospects and constraints;Mukhopadhyay;Nanotechnol Sci Appl,2014

4. Nanoparticles from renewable polymers;Wurm;Front Chem,2015

5. High resolution XPS of organic polymers;Beamson,1992

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