Effects of microwave interference on the operational parameters of n-channel enhancement mode MOSFET devices in CMOS integrated circuits

Author:

Kim Kyechong,Iliadis Agis A.,Granatstein Victor L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference5 articles.

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4. Criteria to reduce failures induced from conveyed EMI on CMOS operational amplifiers;Graffi;Microelectron. Reliab,1997

5. Measured RF induced non-linear effects in digital electronics;Firestone;Proc. ISDRS'03,2003

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