Author:
Kim Dong-Oh,Lee Kitae,Kim Changha,Kim Sihyun,Kim Hyun-Min,Kwon Daewoong,Park Byung-Gook
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference31 articles.
1. Device scaling limits of Si MOSFETs and their application dependencies;Frank;Proc IEEE,2001
2. Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits;Roy;Proc IEEE,2003
3. Silicon CMOS devices beyond scaling;Haensch;IBM J Res Dev,2006
4. Review of FINFET technology;Jurczak,2009
5. 3nm GAA technology featuring multi-bridge-channel FET for low power and high performance applications;Bae,2018
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献