Measurement of brightness temperature of two-dimensional electron gas in channel of a high electron mobility transistor at ultralow dissipation power-Reference-Cited by-同舟云学术

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Measurement of brightness temperature of two-dimensional electron gas in channel of a high electron mobility transistor at ultralow dissipation power

Published:2016-07 Issue: Volume:121 Page:20-24
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Korolev A.M.,Shulga V.M.,Turutanov O.G.,Shnyrkov V.I.

Funder

National Academy of Sciences of Ukraine

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. The single cooper-pair box as a charge qubit;Bladh;New J Phys,2005

2. Low-frequency measurement of the tunneling amplitude in a flux qubit;Grajcar;Phys Rev B,2004

3. Measurement of quantum noise in a single-electron transistor near the quantum limit;Xue;Nat Phys,2009

4. Noise figures of radio receivers;Friis;Proc. IRE,1944

5. Ultrasensitive radio-frequency pseudomorphic high-electron-mobility-transistor readout for quantum devices;Oukhanski;Appl Phys Lett,2004

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design of deeply cooled ultra-low dissipation amplifier and measuring cell for quantum measurements with a microwave single-photon counter;Low Temperature Physics;2024-01-01

2. Investigating the effects of impurity on electron mobility in quasi-one-dimensional wires;Modern Physics Letters B;2023-06-19

3. Ultra-low supply voltage crystal quartz oscillator;Review of Scientific Instruments;2021-05-01

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