Author:
Wang Jun,Li Rui,Dong Yemin,Zou Xin,Shao Li,Shiau W.T.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Kirk effect limitations in high voltage IC’s;Ludikhuize;International Symposium on Power Semiconductor Devices and Ics (ISPSD),1994
2. A theory of transistor cutoff frequency (fT) falloff at high current densities;Kirk;IEEE Transaction on Electron Devices,1962
3. Snapback and safe operating area of ldmos transistors;Hower;IEDM,1999
4. A review of safe operation area;Sun;Microelectronics Journal,2006
5. Hot-electron-induced degradation in high-voltage submicron DMOStransistors;Manzini;International Symposium on Power Semiconductor Devices and Ics (ISPSD),1996
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