Sub-terahertz testing of millimeter wave Monolithic and very large scale integrated circuits-Reference-Cited by-同舟云学术

Sub-terahertz testing of millimeter wave Monolithic and very large scale integrated circuits

Published:2019-05 Issue: Volume:155 Page:44-48
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Shur M.,Rudin S.,Rupper G.,Reed M.,Suarez J.

Funder

U.S. Army Research Laboratory Cooperative Research

Office of Naval Research

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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