Low-frequency noise in bare SOI wafers: Experiments and model

Author:

Pirro L.,Ionica I.,Cristoloveanu S.,Ghibaudo G.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Physics of semiconductor devices;Sze,2006

2. Silicon-on-insulator technology: materials to VLSI;Colinge,1997

3. Electrical Characterization of silicon-on-insulator materials and devices;Cristoloveanu,1995

4. Point-contact pseudo-MOSFET for in-situ characterization of as-grown silicon-on-insulator wafers;Cristoloveanu;IEEE Electron Dev Lett,1992

5. Fast turn characterization of SIMOX wafers;Liu,1990

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2. The pseudo-MOSFET;Fully Depleted Silicon-On-insulator;2021

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