Author:
Nallatamby Jean-Christophe,Abdelhadi Khaled,Jacquet Jean-Claude,Prigent Michel,Floriot Didier,Delage Sylvain,Obregon Juan
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Determination of the trap energy levels and the emitter area dependence of noise in polyemitter bipolar junction transistors from generation–recombination noise spectra;Ng;Can J Phys,1992
2. Determination of the concentration of recombination centers in thin asymmetrical p–n junctions from capacitance transient spectroscopy;Tejada;Appl Phys Lett,2006
3. Size effects on generation-recombination noise;Gomila;Appl Phys Lett,2002
4. Current and voltage noise spectrum due to generation and recombination fluctuations in semiconductors;Zocchi;Phys Rev B,2006
5. Noise in semiconductor devices;Bonani,2001
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