High temperature reliability testing of aluminum and tantalum electrolytic capacitors-Reference-Cited by-同舟云学术

High temperature reliability testing of aluminum and tantalum electrolytic capacitors

Published:2002-06 Issue:6 Volume:42 Page:835-840
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dehbi A.,Wondrak W.,Ousten Y.,Danto Y.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Wondrak W. Passive components: requirements by automotive applications. CARTS 1999. p. 123–6

2. Fägerhot O, Ewell GJ. Solid Ta capacitors: polymer vs manganeous oxide electrolytes––a review. CARTS-EUROPE 2000. p. 135–42

3. Racine JL, Aubry J. An update on capacitors for portable electronics. CARTS EUROPE 2000. p. 130–4

4. Nichicon: application for aluminum electrolytic capacitors. Cat. 8101C

5. Wondrak W, Constapel R, Senske W, Wilde J. Reliability requirements for microtechnologies used in automotive applications. MicroMat 2000 Conference, 17–19 April 2000, Berlin

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