Author:
Charpenel P.,Cavernes P.,Casanovas V.,Borowski J.,Chopin J.M.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. An other way to assess electronics part reliability;Charpenel,1997
2. Mil-Hdbk-217 F
3. Comparison of electronics-reliability assessment approaches;Cushing;IEEE Trans. Reliability,1993
4. Internal report
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