Noise in nanotechnology-Reference-Cited by-同舟云学术

Noise in nanotechnology

Published:2000-11 Issue:11 Volume:40 Page:1833-1837
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Kish L.B,Granqvist C.G

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Lognormal Size Distributions in Particle Growth Processes without Coagulation

2. New approach to the origin of lognormal size distributions of nanoparticles;Kiss;Nanotechnology,1999

3. The real origin of lognormal size distribution of nanoparticle sizes in vapour growth processes;Kiss;Nanostruct Mater,1999

4. Hayashi Ch, Uyeda R, Tasaki A, editors. Ultra-fine particles: exploratory science and technology. Westwood: Noyes; 1997

5. Hihara T, Sumiyama K. Formation and size-control of Ni-cluster by plasma-gas-condensation. J Appl Phys, in press

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