Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. Resolution of Broadband Transducers in Acoustic Microscopy of Encapsulated ICs - Transducer Selection;Canumalla;IEEE Transactions on Components and Packaging Technology,1999
2. Non-Destructive Investigation of Flip Chip Underfill - A Comparison Between Acoustoand Infrared (IR) Microscopy;Lin,1995
3. Nondestructive Elastic Property Characterization of IC Encapsulants;Canumalla,1997
4. Qualification of Underfill Materials for Flip Chip Assemblies;Becker,1998
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24 articles.
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