Conversion of the under bump metallurgy into intermetallics: the impact on flip chip reliability

Author:

Stepniak Frank

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Stepniak F. Estimating flip chip reliability: interactive, temperature-dependent failure mechanisms involving the under bump metallurgy. Proc Int Symp Micro, IMAPS 99, October 1999. p. 427–32

2. Calculation of stress in electrodeposits from the curvature of a plated strip;Brenner;J Res Natl Bur Stand,1949

3. Stepniak F. Solder flip chips employing electroless nickel: an evaluation of reliability and cost. Advances Elec Pack, vol. 1, InterPACK 97, June 1997. p. 353–8

4. Witty MR, Sellers RL, Rosson JM, Walker GG, Meehan MP, Vadas RL, Ward DK. Flip chip assembly on rigid organic laminates. Proc Int Conf Multichip Modules, MCM 98, April 1998

5. Brandenburg S, Yeh S. Electromigration studies of flip chip bump solder joints. Proc Surface Mount Int Conf, SMI 98, August 1998. p. 337–44

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