Device reliability and robust power converter development-Reference-Cited by-同舟云学术

Device reliability and robust power converter development

Published:1999-06 Issue:6-7 Volume:39 Page:1121-1130
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Keskar N.,Trivedi M.,Shenai K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. Framework for Power Package Design and Optimization;Trivedi,1998

2. Failure Mechanisms of IGBTs Under Short-Circuit and Clamped Inductive Switching Stress;Trivedi;IEEE Trans. Power Electronics,1999

3. J. A. Sabate, F. C. Lee et al., “Design Considerations for High-Voltage High-Power Full-Bridge Zero-Voltage Switched PWM Converter” APEC `90, pp. 275–284

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