Long term reliability testing of HV-IGBT modules in worst case traction operation-Reference-Cited by-同舟云学术

Long term reliability testing of HV-IGBT modules in worst case traction operation

Published:1999-06 Issue:6-7 Volume:39 Page:1137-1142
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Fratelli L.,Cascone B.,Glannini G.,Busatto G.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Multichip High Power IGBT modules for traction and industrial application;Sommer;EPE'97,1997

2. Reliability of the 400 A IGBT Modules for Traction Converters. Contribution on the power thermal fatigue influence on life expectancy;Coquery;EPE 95,1995

3. Power traction converter with 3.3 kV IGBT modules;Fratelli;EPE'97,1997

4. “Reliability of Advanced High Power Semiconductor Devices for Railway Traction Application - Project Programme” Project Brite-EuRam N° 95–2105.

5. Reliability of high power IGBT modules testing on thermal fatigue effects due to traction cycles;Hamidi,1997

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